Skills & Technical Expertise

Semiconductor Fabrication and Characterization

Radiation Detection

❋ Mask Aligner
❋ ICP Etcher
❋ Annealing
❋ E-beam evaporation
❋ Wire Bonding
❋ Raman Spectroscopy
❋ XRD
❋ PL
❋ AFM
❋ TEM
❋ Profilometer
❋ Photoresist coating and development
❋Dry Etching
❋ Vacuum systems
❋ GPIB Controlled Sources and Meters
❋ UV exposure
❋ Thermal and Fast neutron detection
❋ Neutron Source 
❋ AmBe/ Cf-252/ 14.1 MeV source
❋ Wafer Processing

RF & Microwave

❋ S-parameters
❋ DPD
❋ Spectrum/Network Analyzers
❋ Large Signal Characterization
❋ Oscilloscope
❋ Origin
❋ MATLAB
❋ Signal Generator
❋ Tanner EDA
❋ VST

Software & Design

❋ C
❋ C++
❋ Cadence/Spectre
❋ ANSYS HFSS
❋ AWR Microwave Office
❋ Origin
❋ MATLAB
❋ Tanner EDA
❋ Keysight ADS
❋ Monochromator
❋Deep UV lasers

Experiment

Analysis

Optimization

Device

→ Experiment → Analysis → Optimization → Device